International Journal of Electronics and Electical Engineering
Article Title
Abstract
In this paper, we report the effect of source/drain metal contacts on the electrical behavior of GeOI MOSFETs. The band diagram and current-voltage characteristics of the MOSFET are obtained using SILVACOATLAS, a 2D numerical device simulator, for various metals having a range of work function values. Our investigation reveals that the device using metals having a work function value more than 5 eV exhibits enhanced ON current, transconductance, intrinsic voltage gain, and also reduced subthreshold slope and OFF current.
Recommended Citation
MONDAL, CHANDRIMA and BISWAS, ABHIJIT
(2014)
"STUDIES ON GE-ON-INSULATOR MOSFETS USING METAL SOURCE/DRAIN CONTACTS FOR ANALOG/ MIXED SIGNAL APPLICATIONS,"
International Journal of Electronics and Electical Engineering: Vol. 2:
Iss.
4, Article 14.
DOI: 10.47893/IJEEE.2014.1116
Available at:
https://www.interscience.in/ijeee/vol2/iss4/14
DOI
10.47893/IJEEE.2014.1116