Due to the constant development in the integrated circuits, the automatic test pattern generation problem become more vital for sequential vlsi circuits in these days. Also testing of integrating circuits and systems has become a difficult problem. In this paper we have discussed the problem of the automatic test sequence generation using particle swarm optimization(PSO) and technique for structure optimization of a deterministic test pattern generator using genetic algorithm(GA).
Mohanty, Monalisa and Patnaik, S. N.
"Soft Computing Approach To Automatic Test Pattern Generation For Sequential Vlsi Circuit,"
International Journal of Computer and Communication Technology: Vol. 4
, Article 7.
Available at: https://www.interscience.in/ijcct/vol4/iss1/7